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Primo D-RIE

AMEC's 300-mm Primo D-RIE™ very high frequency[De-coupled Reactive Ion Etch] tool is built for 65/45/28-nm Etch applications covering a wide range of etch and stop-layer films, such as SiO2, low k, Si, SiN, SiON, SiC, and amorphous carbon.

The high-productivity, high-performance cluster tool can be flexibly configured with up to three dual-station process modules. Each module is capable of processing two wafers simultaneously. It can also be configured for single-wafer processing. The product features proprietary technology, including a VHF and LF RF system plasma source, an FEIS plasma confinement system and a unique SiC showerhead design.

Key Technology Features and Advantages

Very High Frequency De-coupled RIE enables independent ion density and energy control for effective process control knobs

Symmetrically distributed and direct RF feed for VHF RF enables precise control for repeatable results in a production environment

Proprietary, plasma confinement enables process stability with high flow conductance for a wide process window

Independent RF onboard uniformity control unit and endpoint control per station enables each wafer to run in a single-chamber environment

Bottom-powered, high-frequency RF enables stable, low pressure, high plasma density strip to preserve the integrity of low-k materials

Proprietary, self-isolated RF match for quick, repeatable frequency-tuning capability

High-purity, plasma-resistant chamber materials for very low defectivity and low cost of consumables

Direct resistive top electrode heating with closed-loop control enables precise and speedy temperature control for consistent wafer processing

Mini-batch cluster architecture – featuring up to six single-wafer process stations delivers excellent throughput in a smaller footprint

Modular system architecture facilitates easy installation and maintenance

For more information on the Primo D-RIE, please email info@amecnsh.com